|
|
Other articles related with "reverse bias stress"：
|
|
87308 |
Linna Zhao(赵琳娜), Peihong Yu(于沛洪), Zixiang Guo(郭子骧), Dawei Yan(闫大为), Hao Zhou(周浩), Jinbo Wu(吴锦波), Zhiqiang Cui(崔志强), Huarui Sun(孙华锐), Xiaofeng Gu(顾晓峰) |
| |
|
Progressive current degradation and breakdown behavior in GaN LEDs under high reverse bias stress |
| |
|
|
Chin. Phys. B
2017 Vol.26 (8): 87308-087308
[Abstract]
(714)
[HTML 1 KB]
[PDF 1376 KB]
(241)
|
| First page | Previous Page | Next Page | Last Page | Page 1 of 1 |
|
|
